Polar Home

Accessories for PFL & T Series

Interfacing PFL & T Series Fault Locators to the PCB or device under test

Regardless of whether you work in an electronics manufacturing or service environment, interfacing test equipment to the board or component under test can pose problems.

 

 

Dedicated bed-of-nails test fixtures offer simple multi-channel access, but are expensive and only suitable for use in high volume production processes. Conversely, with single-point probes, you need to sequentially re-position the probe on each component pin in turn, making data acquisition laboriously slow and inefficient.

To overcome these problems, most people choose multi-pin probes and clips, but even these are beginning to suffer from disadvantages. Surface-mount component technology and fine-pitch PCB fabrication geometries can make it difficult to obtain reliable electrical connections with the device under test. Furthermore, today's high component packing densities often preclude the use of conventional IC probes and clips altogether, due to lack of physical access.

Freedom of choice

To help you use PFL and T Series fault locators to test any type of PCB — regardless of its fabrication technology or component density — Polar Instruments produces a comprehensive range of ultra-compact multi-pin probes for both surface-mount and through-hole components. We also offer a range of high quality conventional IC test clips, together with interface adapters to allow a number of clips to be connected to the same instrument.

 

 

Ultra-compact probes

The perfect solution for fault-finding on densely-packed PCBs, our T Series probes provide an ergonomic and cost-effective interface between the test instrument and the component under test. Exceptionally small tip dimensions, combined with a tapered head design, enable you to use the probes even when there is insufficient room for conventional test clips.

The T Series probe range includes four dual-in-line models — two for standard through-hole mounting ICs, and two for small-outline devices — and nine single-in-line models, seven of which are for use with surface-mount components. Overall, the range covers pin counts from 10 to 32, and pin pitches from 0.1in down to just 0.4mm.

All T Series SMD probes feature a unique retractable comb, which protects the probe pins and prevents individual pins from slipping off the IC when in use. The probe pins are individually spring-loaded to ensure positive contact, and are user-replaceable - a significant advantage over conventional test clips.
(See table 1)

IC test clips

We offer 25 different types of IC test clip, to cater for the majority of component packages that you are likely to meet. Each test clip is supplied complete with a ribbon cable, terminated with a plug-in connector for a PFL or T Series instrument. You can order individual test clips, or Test Packs.

There are twelve types of test clip available for use with standard through-hole mounting dual-in-line ICs, covering pin counts from 8 to 40 and IC widths of 0.3in and 0.6in. For small-outline ICs, you have a choice of six test clips, offering pin counts from 8 to 28; each of these can accommodate an IC width of 0.1 to 0.2in, making it suitable for both SO and SO(W) packages.

Rounding out the range are seven IC test clips designed specifically for use with plastic leaded-chip carriers (PLCCs) and quad flat packs (QFPs). Offering pin counts from 20 to 84, the clips feature a sliding collar to ensure fast, trouble-free interconnections.
(See table 2)

Interface adapters

Polar's interface adapters enable you to customize connections between the test instrument and the board or component under test, in a very flexible manner. The range of adapters includes models that allow you to connect multiple test clips to one instrument, cross-patch signals via a routing matrix, and test individual devices in a zero insertion force socket.

Several of the adapters allow you to wire custom connectors to suit your PCBs. You can test boards via their edge connectors, for example, which is particularly effective. The T41283 is supplied with an edge connector suitable for PC card testing.
(See table 3)

(Table 1) SMD and IC Probes
  IC pitch IC width Probe pin count Probe pin format Part number ACC178 pack
single in line            
  0.4mm _ 32 single-in-line T141 *
  0.5mm _ 32 single-in-line T140 *
  0.65mm _ 32 single-in-line T137 *
  0.8mm _ 16 single-in-line T139 *
  1.0mm _ 14 single-in-line T136 *
  0.025in _ 32 single-in-line T138 *
  0.050in _ 11 single-in-line T131 *
  0.1in _ 10 single-in-line T132  
  0.1in _ 10 single-in-line** T132/N  
             
  IC pitch IC width Probe pin count Probe pin format Part number ACC178 pack
dual in line            
  0.1in 0.3in 16 dual in line T203  
  0.1in 0.3in 20 dual in line T204  
             
  IC pitch IC width Probe pin count Probe pin format Part number ACC178 pack
small outline            
  0.05in 0.1in 16 dual in line T201 *
  0.05in 0.2in 20 dual in line T202 *
             
  IC pitch IC width Probe pin count Probe pin format Part number ACC178 pack
Transistor            
  SOT23 transistor probe ACC166  
             
** Flux-piercing pins

 

(Table 2) Test clips
  IC width Probe pin count Part number ACC139 pack ACC140 pack
DIL Ics          
  0.3in 8 ASY116 * *
  0.3in 14 ASY115 * *
  0.3in 16 ASY107 supplied with product
  0.3in 18 ASY117 * *
  0.3in 20 ASY110 * *
  0.3in 22 ASY118 * *
  0.6in 22 ASY120 * *
  0.3in 24 ASY112    
  0.6in 24 ASY114 * *
  0.3in 28 ASY119 * *
  0.6in 28 ASY113 * *
  0.6in 40 ASY106 supplied with product
           
  IC width Probe pin count Part number ACC160 pack  
SO & SO(W) Ics          
  0.1in to 0.2in 8 ASY123 *  
  0.1in to 0.2in 14 ASY124 *  
  0.1in to 0.2in 16 ASY125 *  
  0.1in to 0.2in 20 ASY126 *  
  0.1in to 0.2in 24 ASY127 *  
  0.1in to 0.2in 28 ASY128 *  
           
  Probe pin count Part number ACC161 pack    
PLCCs & QFPs          
  20 ASY129 *    
  28 ASY130 *    
  32 ASY131 *    
  44 ASY132** *    
  52 ASY133** *    
  68 ASY134** *    
  84 ASY135** *    
           
** These clips require interface ACC169 when used with the T4000, TD8000, PFL760 or PFL780.

 

(Table 3) Custom interface adapters
Description Part number
Five 40-way connectors, enabling five test clips (or equivalent) to be connected to one 40-channel input of an instrument. ACC137
 
Single 40-way ZIF socket, connecting to one 40-channel input of an instrument. ACC145
 
Single PCB (210mm x 145mm) with a signal routing matrix, connecting to the two 64-channel inputs of an instrument. T41282
 
Single PCB (210mm x 145mm) with a signal routing matrix and an edge connector for PC cards, connecting to the two 64-channel inputs of an instrument. T41283