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Accessories for PFL & T SeriesInterfacing PFL & T Series Fault Locators to the PCB or device under test |
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Regardless
of whether you work in an electronics manufacturing or
service environment, interfacing test equipment to the
board or component under test can pose problems.
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Dedicated bed-of-nails test
fixtures offer simple multi-channel access, but are
expensive and only suitable for use in high volume
production processes. Conversely, with single-point
probes, you need to sequentially re-position the probe on
each component pin in turn, making data acquisition
laboriously slow and inefficient. To overcome these problems, most people choose multi-pin probes and clips, but even these are beginning to suffer from disadvantages. Surface-mount component technology and fine-pitch PCB fabrication geometries can make it difficult to obtain reliable electrical connections with the device under test. Furthermore, today's high component packing densities often preclude the use of conventional IC probes and clips altogether, due to lack of physical access. |
Freedom of choice To help you use PFL and T Series fault locators to test any type of PCB — regardless of its fabrication technology or component density — Polar Instruments produces a comprehensive range of ultra-compact multi-pin probes for both surface-mount and through-hole components. We also offer a range of high quality conventional IC test clips, together with interface adapters to allow a number of clips to be connected to the same instrument.
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Ultra-compact probes The perfect solution for fault-finding on densely-packed PCBs, our T Series probes provide an ergonomic and cost-effective interface between the test instrument and the component under test. Exceptionally small tip dimensions, combined with a tapered head design, enable you to use the probes even when there is insufficient room for conventional test clips. The T Series probe range includes four dual-in-line models — two for standard through-hole mounting ICs, and two for small-outline devices — and nine single-in-line models, seven of which are for use with surface-mount components. Overall, the range covers pin counts from 10 to 32, and pin pitches from 0.1in down to just 0.4mm. All T Series SMD probes
feature a unique retractable comb, which protects the
probe pins and prevents individual pins from slipping off
the IC when in use. The probe pins are individually
spring-loaded to ensure positive contact, and are
user-replaceable - a significant advantage over
conventional test clips. IC test clips We offer 25 different types of IC test clip, to cater for the majority of component packages that you are likely to meet. Each test clip is supplied complete with a ribbon cable, terminated with a plug-in connector for a PFL or T Series instrument. You can order individual test clips, or Test Packs. There are twelve types of test clip available for use with standard through-hole mounting dual-in-line ICs, covering pin counts from 8 to 40 and IC widths of 0.3in and 0.6in. For small-outline ICs, you have a choice of six test clips, offering pin counts from 8 to 28; each of these can accommodate an IC width of 0.1 to 0.2in, making it suitable for both SO and SO(W) packages. Rounding out the range
are seven IC test clips designed specifically for use
with plastic leaded-chip carriers (PLCCs) and quad flat
packs (QFPs). Offering pin counts from 20 to 84, the
clips feature a sliding collar to ensure fast,
trouble-free interconnections. Interface adapters Polar's interface adapters enable you to customize connections between the test instrument and the board or component under test, in a very flexible manner. The range of adapters includes models that allow you to connect multiple test clips to one instrument, cross-patch signals via a routing matrix, and test individual devices in a zero insertion force socket. Several of the adapters
allow you to wire custom connectors to suit your PCBs.
You can test boards via their edge connectors, for
example, which is particularly effective. The T41283 is
supplied with an edge connector suitable for PC card
testing. |
(Table 1) SMD and IC Probes | ||||||
IC pitch | IC width | Probe pin count | Probe pin format | Part number | ACC178 pack | |
single in line | ||||||
0.4mm | _ | 32 | single-in-line | T141 | * | |
0.5mm | _ | 32 | single-in-line | T140 | * | |
0.65mm | _ | 32 | single-in-line | T137 | * | |
0.8mm | _ | 16 | single-in-line | T139 | * | |
1.0mm | _ | 14 | single-in-line | T136 | * | |
0.025in | _ | 32 | single-in-line | T138 | * | |
0.050in | _ | 11 | single-in-line | T131 | * | |
0.1in | _ | 10 | single-in-line | T132 | ||
0.1in | _ | 10 | single-in-line** | T132/N | ||
IC pitch | IC width | Probe pin count | Probe pin format | Part number | ACC178 pack | |
dual in line | ||||||
0.1in | 0.3in | 16 | dual in line | T203 | ||
0.1in | 0.3in | 20 | dual in line | T204 | ||
IC pitch | IC width | Probe pin count | Probe pin format | Part number | ACC178 pack | |
small outline | ||||||
0.05in | 0.1in | 16 | dual in line | T201 | * | |
0.05in | 0.2in | 20 | dual in line | T202 | * | |
IC pitch | IC width | Probe pin count | Probe pin format | Part number | ACC178 pack | |
Transistor | ||||||
SOT23 transistor probe ACC166 | ||||||
** Flux-piercing pins |
(Table 2) Test clips | |||||
IC width | Probe pin count | Part number | ACC139 pack | ACC140 pack | |
DIL Ics | |||||
0.3in | 8 | ASY116 | * | * | |
0.3in | 14 | ASY115 | * | * | |
0.3in | 16 | ASY107 | supplied with product | ||
0.3in | 18 | ASY117 | * | * | |
0.3in | 20 | ASY110 | * | * | |
0.3in | 22 | ASY118 | * | * | |
0.6in | 22 | ASY120 | * | * | |
0.3in | 24 | ASY112 | |||
0.6in | 24 | ASY114 | * | * | |
0.3in | 28 | ASY119 | * | * | |
0.6in | 28 | ASY113 | * | * | |
0.6in | 40 | ASY106 | supplied with product | ||
IC width | Probe pin count | Part number | ACC160 pack | ||
SO & SO(W) Ics | |||||
0.1in to 0.2in | 8 | ASY123 | * | ||
0.1in to 0.2in | 14 | ASY124 | * | ||
0.1in to 0.2in | 16 | ASY125 | * | ||
0.1in to 0.2in | 20 | ASY126 | * | ||
0.1in to 0.2in | 24 | ASY127 | * | ||
0.1in to 0.2in | 28 | ASY128 | * | ||
Probe pin count | Part number | ACC161 pack | |||
PLCCs & QFPs | |||||
20 | ASY129 | * | |||
28 | ASY130 | * | |||
32 | ASY131 | * | |||
44 | ASY132** | * | |||
52 | ASY133** | * | |||
68 | ASY134** | * | |||
84 | ASY135** | * | |||
** These clips require interface ACC169 when used with the T4000, TD8000, PFL760 or PFL780. |
(Table 3) Custom interface adapters | |||||
Description | Part number | ||||
Five 40-way connectors, enabling five test clips (or equivalent) to be connected to one 40-channel input of an instrument. | ACC137 | ||||
Single 40-way ZIF socket, connecting to one 40-channel input of an instrument. | ACC145 | ||||
Single PCB (210mm x 145mm) with a signal routing matrix, connecting to the two 64-channel inputs of an instrument. | T41282 | ||||
Single PCB (210mm x 145mm) with a signal routing matrix and an edge connector for PC cards, connecting to the two 64-channel inputs of an instrument. | T41283 |