The Polar Instruments Si9000e Transmission Line Field Solver incorporates fast and accurate frequency-dependent PCB transmission line modelling. The Si9000e provides for both lossless and frequency-dependent modelling and extracts full transmission line parameters for a wide range of PCB transmission lines. The Si9000e uses advanced field solving methods to calculate PCB trace impedance for most single-ended and differential circuit designs. Based on Boundary Element analysis, the Field Solver is able to provide rapid modelling for a wide range of microstrip, stripline and coplanar structures.
Lossless calculations
The Field Solver provides for rapid calculation of single PCB trace impedance values against significant PCB parameters (e.g. trace height and thickness, dielectric constant, etc.) Given a target impedance the goal seeking functions of the Si9000 allow the user to calculate circuit parameter values to achieve the desired impedance.
For situations with structure dimensional constraints, the Field Solver allows the designer and board fabricator easily to accommodate variations in supplier material dimensions.
The Si9000e supports single or multiple dielectric builds in a comprehensive range of trace and dielectric configurations. The Si9000 provides models for structures with dielectric layers above and below traces, soldermask modelling and includes compensation for resin rich areas between traces.
Frequency-dependent calculations
Employing its Boundary Element Method field solving, the Si9000e extracts RLGC matrices and 2-Port (single-ended) or 4-Port (differential) S-Parameters and rapidly plots transmission line information for the structure under design. Graphing against frequency is provided for impedance magnitude, loss (conductor loss, dielectric loss and insertion loss), inductance, capacitance, resistance, conductance and skin depth. The Polar Si9000e runs within the Microsoft Windows environment and provides for simple transfer of table data to external programs such as spreadsheets or databases for subsequent analysis.
Extended substrate data
The Si9000e frequency-dependent calculations can be refined using extended substrate data. Users can assign substrate values by frequency band to accommodate material from manufacturers who specify parameters (e.g. Er and loss tangent) that vary by frequency.